Description
The TEE_PopulateTransientObject and __utee_from_attr functions in Samsung mTower 0.3.0 allow a trusted application to trigger a memory overwrite, denial of service, and information disclosure by invoking the function TEE_PopulateTransientObject with a large number in the parameter attrCount.
Published: 2022-08-04
Score: 7.8 High
EPSS: < 1% Very Low
KEV: No
Impact: n/a
Action: n/a
AI Analysis

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Remediation

No vendor fix or workaround currently provided.

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Tracking

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Advisories
Source ID Title
EUVD EUVD EUVD-2022-38731 The TEE_PopulateTransientObject and __utee_from_attr functions in Samsung mTower 0.3.0 allow a trusted application to trigger a memory overwrite, denial of service, and information disclosure by invoking the function TEE_PopulateTransientObject with a large number in the parameter attrCount.
History

No history.

cve-icon MITRE

Status: PUBLISHED

Assigner: mitre

Published:

Updated: 2024-08-03T09:44:22.150Z

Reserved: 2022-07-13T00:00:00.000Z

Link: CVE-2022-35858

cve-icon Vulnrichment

No data.

cve-icon NVD

Status : Modified

Published: 2022-08-04T20:15:20.013

Modified: 2024-11-21T07:11:49.500

Link: CVE-2022-35858

cve-icon Redhat

No data.

cve-icon OpenCVE Enrichment

No data.

Weaknesses