Description
The TEE_PopulateTransientObject and __utee_from_attr functions in Samsung mTower 0.3.0 allow a trusted application to trigger a memory overwrite, denial of service, and information disclosure by invoking the function TEE_PopulateTransientObject with a large number in the parameter attrCount.
Analysis and contextual insights are available on OpenCVE Cloud.
Remediation
No vendor fix or workaround currently provided.
Additional remediation guidance may be available on OpenCVE Cloud.
Tracking
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Advisories
| Source | ID | Title |
|---|---|---|
EUVD |
EUVD-2022-38731 | The TEE_PopulateTransientObject and __utee_from_attr functions in Samsung mTower 0.3.0 allow a trusted application to trigger a memory overwrite, denial of service, and information disclosure by invoking the function TEE_PopulateTransientObject with a large number in the parameter attrCount. |
References
History
No history.
Status: PUBLISHED
Assigner: mitre
Published:
Updated: 2024-08-03T09:44:22.150Z
Reserved: 2022-07-13T00:00:00.000Z
Link: CVE-2022-35858
No data.
Status : Modified
Published: 2022-08-04T20:15:20.013
Modified: 2024-11-21T07:11:49.500
Link: CVE-2022-35858
No data.
OpenCVE Enrichment
No data.
Weaknesses
EUVD