Description
TEE_Malloc in Samsung mTower through 0.3.0 allows a trusted application to achieve Excessive Memory Allocation via a large len value, as demonstrated by a Numaker-PFM-M2351 TEE kernel crash.
Published: 2022-08-11
Score: 7.5 High
EPSS: < 1% Very Low
KEV: No
Impact: n/a
Action: n/a
AI Analysis

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Remediation

No vendor fix or workaround currently provided.

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Tracking

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Advisories
Source ID Title
EUVD EUVD EUVD-2022-40752 TEE_Malloc in Samsung mTower through 0.3.0 allows a trusted application to achieve Excessive Memory Allocation via a large len value, as demonstrated by a Numaker-PFM-M2351 TEE kernel crash.
History

No history.

cve-icon MITRE

Status: PUBLISHED

Assigner: mitre

Published:

Updated: 2024-08-03T10:45:52.690Z

Reserved: 2022-08-11T00:00:00.000Z

Link: CVE-2022-38155

cve-icon Vulnrichment

No data.

cve-icon NVD

Status : Modified

Published: 2022-08-11T01:15:10.917

Modified: 2024-11-21T07:15:54.377

Link: CVE-2022-38155

cve-icon Redhat

No data.

cve-icon OpenCVE Enrichment

No data.

Weaknesses